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Related Concept Videos

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Total Internal Reflection Fluorescence Microscopy01:05

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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 23, 2026

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
09:14

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

Published on: October 2, 2012

Amplified total internal reflection.

J Fan, A Dogariu, L J Wang

    Optics Express
    |May 23, 2009
    PubMed
    Summary
    This summary is machine-generated.

    Totally internal reflected beams can be amplified in active lower-index media. This study analytically derives Goos-Hänchen shifts for Gaussian beams, revealing a "1/2" rule for TE mode energy transfer.

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    High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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    High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

    Published on: November 16, 2019

    Area of Science:

    • Optics and Photonics
    • Quantum Optics
    • Laser Physics

    Background:

    • Total internal reflection (TIR) is a fundamental optical phenomenon.
    • Gain media can amplify light, but its effect on TIR shifts is less explored.
    • Gaussian beams exhibit unique reflection properties.

    Purpose of the Study:

    • To analytically investigate the Goos-Hänchen shifts of Gaussian beams at the interface with an active or absorptive lower-index medium.
    • To explore the energy flow dynamics under these conditions.
    • To identify novel phenomena related to light amplification during TIR.

    Main Methods:

    • Analytical derivation of Goos-Hänchen shifts for Gaussian beams.
    • Analysis of reflection and refraction phenomena.
    • Examination of energy flow and shift behavior for active and absorptive media.
    • Comparison of analytical results with numerical simulations.

    Main Results:

    • An analytical expression for Goos-Hänchen shifts in active and absorptive lower-index media was derived.
    • Energy flow and shift variations were analyzed for different scenarios.
    • For the transverse electric (TE) mode, a "1/2" rule was observed: the transmitted beam's Goos-Hänchen shift is precisely half that of the reflected beam.
    • Analytical findings were validated by numerical results.

    Conclusions:

    • Light amplification in lower-index gain media can significantly influence total internal reflection.
    • The derived analytical framework accurately predicts Goos-Hänchen shifts.
    • The discovered "1/2" rule for TE mode offers new insights into energy partitioning during amplified TIR.