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Related Concept Videos

X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Single-element elliptical hard x-ray micro-optics.

Kenneth Evans-Lutterodt, James Ablett, Aaron Stein

    Optics Express
    |May 23, 2009
    PubMed
    Summary
    This summary is machine-generated.

    Researchers developed a novel silicon kinoform lens for X-rays, significantly reducing absorption. This innovation enables high-resolution focusing and imaging applications with improved performance.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • X-ray Science

    Background:

    • Traditional X-ray optics face limitations due to material absorption and fabrication constraints.
    • Optimizing optics for specific wavelengths is crucial for reducing energy loss.
    • Short focal lengths and high magnification are desirable for advanced X-ray applications.

    Purpose of the Study:

    • To design and fabricate a single-element kinoform lens in silicon for 12.398 keV X-rays.
    • To minimize absorption losses by optimizing the lens profile for a fixed wavelength.
    • To achieve high demagnification and improved resolution for X-ray focusing and imaging.

    Main Methods:

    • Utilized micro-fabrication techniques to create a single-crystal silicon kinoform lens.
    • Engineered an elliptical profile optimized for 12.398 keV X-rays.
    • Removed phase-shifting regions to reduce material absorption.

    Main Results:

    • Successfully manufactured a single-element kinoform lens with an elliptical profile.
    • Achieved significantly reduced absorption by optimizing for a fixed X-ray wavelength.
    • Demonstrated a one-micron line focus (full width at half maximum) at the National Synchrotron Light Source beamline.

    Conclusions:

    • The developed silicon kinoform lens offers reduced absorption and enables short focal lengths.
    • This technology allows for high demagnification of synchrotron X-ray sources.
    • The improved optics provide enhanced resolution for X-ray focusing and imaging applications.