Related Experiment Video

Updated: Jun 22, 2026

Building Langmuir Probes and Emissive Probes for Plasma Potential Measurements in Low Pressure, Low Temperature Plasmas
08:10

Building Langmuir Probes and Emissive Probes for Plasma Potential Measurements in Low Pressure, Low Temperature Plasmas

Published on: May 25, 2021

Herman Yaggi Carr, PhD (1924-2008): a tribute

Vivian S Lee1

  • 1Department of Radiology, New York University Langone Medical Center, New York, New York, USA. vivian.lee@med.nyu.edu

Journal of Magnetic Resonance Imaging : JMRI
|May 28, 2009
PubMed
Summary

No abstract available in PubMed .

More Related Videos

A Microfluidic Device for Studying Multiple Distinct Strains08:15

A Microfluidic Device for Studying Multiple Distinct Strains

Published on: November 9, 2012

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis07:55

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

Published on: September 22, 2017

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...