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Physics process level discrimination of detections for GATE: assessment of contamination in SPECT and spurious

Jan De Beenhouwer1, Steven Staelens, Stefaan Vandenberghe

  • 1Department of Electronics and Information Systems, MEDISIP, Ghent University-IBBT-IBiTech, De Pintelaan 185 Block B, B-9000 Ghent, Belgium. jan.debeenhouwer@ugent.be

Medical Physics
|May 29, 2009
PubMed

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