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Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector

P Walther1, R Autrata, Y Chen

  • 1Integrated Microscopy Resource for Biomedical Research, University of Wisconsin-Madison 53706.

Scanning Microscopy
|June 1, 1991
PubMed
Summary

A new double layer coating method enhances high-resolution scanning electron microscopy (SEM) imaging of biological samples. Optimizing accelerating voltage (Vo) improved contrast for backscattered electron (BSE) imaging, revealing detailed 3D structures.

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