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Updated: Jun 22, 2026

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
Published on: November 9, 2015
Photosensitivity of ion-exchanged Er-doped phosphate glass using 248nm excimer laser radiation
Abstract:
The photosensitivity to 248nm excimer laser radiation of Er-doped Schott IOG-1 phosphate glass is presented. The photosensitive mechanism is investigated by employing a grating recording process. Index changes of up to ~2.0x10(-3) were measured in silver ion-exchanged samples using diffraction efficiency measurements; whereas changes of only ~10(-5) were measured for non-ion-exchanged samples. Absorption measurements allowed the identification of specific color center bands, which were attributed to the glass matrix and to the silver ions. Investigation of the exposed ion-exchanged glass using scanning electron microscopy and energy dispersive x-ray microanalysis revealed that in addition to the color centers formed, silver ion migration and ionization contribute significantly to the UV-induced index changes.

