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Measurement of the unstained biological sample by a novel scanning electron generation X-ray microscope based on SEM

Toshihiko Ogura1

  • 1Neuroscience Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono, Tsukuba, Ibaraki 305-8568, Japan. t-ogura@aist.go.jp

Biochemical and Biophysical Research Communications
|June 3, 2009
PubMed

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