Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP<sub>2</sub>S<sub>6</sub><sup></sup>.

Nanotechnology·2023

Same author

S1 guidelines "lumbar puncture and cerebrospinal fluid analysis" (abridged and translated version).

Neurological research and practice·2020

Same author

Author Correction: Improving superconductivity in BaFe<sub>2</sub>As<sub>2</sub>-based crystals by cobalt clustering and electronic uniformity.

Scientific reports·2018

Same author

Deep data analysis via physically constrained linear unmixing: universal framework, domain examples, and a community-wide platform.

Advanced structural and chemical imaging·2018

Same author

Ultrafast current imaging by Bayesian inversion.

Nature communications·2018

Same author

Quantification of flexoelectricity in PbTiO<sub>3</sub>/SrTiO<sub>3</sub> superlattice polar vortices using machine learning and phase-field modeling.

Nature communications·2017

Search research articles

Related Experiment Video

Updated: Jun 22, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry.

Oleg S Ovchinnikov¹, S Jesse, S V Kalinin

¹Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA.

|June 4, 2009

Summary

This study introduces adaptive scanning for scanning probe microscopy (SPM) to efficiently image complex surfaces. The method focuses data acquisition on key features, improving analysis of nanowires and interfaces.

More Related Videos

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Published on: June 12, 2018

Related Experiment Videos

Last Updated: Jun 22, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Published on: June 12, 2018

Area of Science:

Materials Science
Surface Science
Nanotechnology

Background:

Scanning probe microscopy (SPM) faces challenges in analyzing surfaces with non-uniform information density.
Efficient characterization of complex nanostructures like nanowires and disordered interfaces is crucial.

Purpose of the Study:

To develop and demonstrate an adaptive scanning method for SPM.
To apply this method to piezoresponse force microscopy (PFM) for enhanced surface analysis.
To establish fractal and self-affine characterization approaches for domain interfaces.

Main Methods:

Implemented a path-engineered SPM technique involving a pre-scan to identify features of interest.
Acquired a secondary scan with concentrated pixel density around identified features.
Developed fractal and self-affine analysis methods for domain interfaces.

Main Results:

Demonstrated the adaptive scanning approach in piezoresponse force microscopy.
Established relationships between variational roughness, structure factor, and correlation functions.
Quantified the impact of resolution on these critical surface parameters.

Conclusions:

Adaptive scanning significantly enhances the efficiency and detail of SPM studies on complex surfaces.
The developed fractal and self-affine characterization methods provide new tools for analyzing domain interfaces.
Understanding resolution effects is key for accurate interpretation of surface morphology and properties.