Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

$X-ray Diffraction of Biological Samples$ 01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Impact of localized defects in light scattered by optical components: measurement and analysis.

Optics express·2025

Same author

Mechanisms driving self-organization phenomena in random plasmonic metasurfaces under multipulse femtosecond laser exposure: a multitime scale study.

Nanophotonics (Berlin, Germany)·2024

Same author

Power transfer efficiency for obstructed wireless links using Bessel beams.

Optics express·2023

Same author

Instantaneous measurement of surface roughness spectra using white-light scattering projected on a spectrometer.

Applied optics·2023

Same author

Low coherence interferometric detection of the spectral dependence of the retro-reflection coefficient of an anti-reflective coated interface.

Optics express·2023

Same author

Analysis of the multilayer organization of a sunflower leaf during dehydration with terahertz time-domain spectroscopy.

Optics express·2022

Search research articles

Related Experiment Video

Updated: Jun 22, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks.

Olivier Gilbert, Carole Deumié, Claude Amra

|June 5, 2009

Summary

A new Ellipsometry of Angle-Resolved Scattering (E.A.R.S.) technique accurately extracts angular phase data from polarized light scattering measurements. This method distinguishes surface from bulk scattering, regardless of sample type or scattering intensity.

More Related Videos

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Related Experiment Videos

Last Updated: Jun 22, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Area of Science:

Optics and Photonics
Materials Science

Background:

Scattering measurements provide insights into material properties.
Distinguishing surface from bulk scattering is crucial for accurate analysis.
Polarized light offers enhanced sensitivity in optical measurements.

Purpose of the Study:

To develop a novel technique for extracting accurate angular phase data.
To enable differentiation between surface and bulk scattering phenomena.
To analyze phase data within speckle patterns.

Main Methods:

Utilizing a laboratory-developed technique: Ellipsometry of Angle-Resolved Scattering (E.A.R.S.).
Performing angle-resolved scattering measurements with polarized light.
Analyzing phase data extracted from scattering measurements and speckle patterns.

Main Results:

Accurate angular phase data successfully extracted from scattering measurements.
The E.A.R.S. technique effectively distinguishes surface from bulk scattering.
Scattering levels and sample types did not impede the differentiation.

Conclusions:

The E.A.R.S. technique offers a robust method for analyzing scattering phenomena.
Accurate phase data extraction is achievable for diverse sample types.
This technique advances the study of light-matter interactions in materials.