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Updated: Jun 22, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
10:42

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Published on: June 16, 2016

Analysis of position-dependent light extraction of GaN-based LEDs

Tsung-Xian Lee, Chao-Ying Lin, Shih-Hsin Ma

    Optics Express
    |June 5, 2009
    PubMed

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