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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Related Experiment Video

Updated: Jun 22, 2026

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
13:31

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis

Published on: December 22, 2015

Broadband supercontinuum interferometer for high-resolution profilometry.

D Reolon, M Jacquot, I Verrier

    Optics Express
    |June 9, 2009
    PubMed
    Summary
    This summary is machine-generated.

    This study demonstrates a new white light supercontinuum source for improved interferometric measurements. The technique achieves subnanometer resolution for high-resolution profilometry without mechanical scanning.

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    Last Updated: Jun 22, 2026

    High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
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    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
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    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    Area of Science:

    • Optical Physics
    • Metrology
    • Materials Science

    Background:

    • Interferometric techniques are crucial for high-resolution measurements.
    • Traditional methods often face limitations in fringe visibility and scanning requirements.
    • Supercontinuum sources offer broad spectral bandwidth for advanced optical applications.

    Purpose of the Study:

    • To investigate the use of a white light supercontinuum source for enhancing interferometric fringe visibility.
    • To develop a high-resolution profilometric measurement technique.
    • To achieve subnanometer resolution without mechanical scanning.

    Main Methods:

    • Generation of a white light supercontinuum in air-silica microstructured optical fiber.
    • Pumping the fiber with picosecond pulses.
    • Utilizing a spectral interferometer for data acquisition.
    • Applying a seven-point algorithm for phase calculation.

    Main Results:

    • The white light supercontinuum source significantly improved fringe visibility in interferometric acquisitions.
    • The combined system achieved high-resolution profilometric measurements.
    • Theoretical subnanometer resolution was demonstrated using the seven-point algorithm.
    • Single-shot image analysis enabled one-line profiling of large surfaces.

    Conclusions:

    • The developed white light supercontinuum source is effective for improving interferometric measurements.
    • This approach enables high-resolution profilometry with subnanometer precision.
    • The method offers a non-contact, non-scanning solution for surface characterization.