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Updated: Jun 22, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

Broad angular multilayer analyzer for soft X-rays

Z S Wang, H C Wang, J T Zhu

    Optics Express
    |June 9, 2009
    PubMed

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