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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 22, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions.

Boris J Albers1, Todd C Schwendemann, Mehmet Z Baykara

  • 1Department of Mechanical Engineering and Center for Research on Interface Structures and Phenomena, Yale University, PO Box 208284, New Haven, CT 06520, USA.

Nanotechnology
|June 11, 2009
PubMed
Summary
This summary is machine-generated.

This study presents new methods for noncontact atomic force microscopy (nc-AFM) to create detailed 3D force maps. These techniques significantly reduce measurement times and improve resolution for atomic-scale surface analysis.

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Quantitative Hardness Measurement by Instrumented AFM-indentation
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Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

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Last Updated: Jun 22, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Area of Science:

  • Surface science
  • Atomic force microscopy
  • Nanotechnology

Background:

  • High-resolution 3D force mapping is crucial for understanding surface interactions.
  • Long acquisition times and tip changes are major limitations in current nc-AFM techniques.
  • Low-temperature operation partially mitigates drift and tip degradation issues.

Purpose of the Study:

  • To present novel data acquisition and analysis procedures for nc-AFM.
  • To enable the recording of dense 3D surface force and energy fields with atomic resolution.
  • To overcome limitations of long acquisition times and data distortion.

Main Methods:

  • An image-by-image data acquisition scheme was employed to minimize redundant data recording.
  • Post-acquisition drift correction was implemented to improve data accuracy.
  • Measurements were performed on highly oriented pyrolytic graphite in ultrahigh vacuum at 6 K.

Main Results:

  • Achieved piconewton force mapping with <7 pm lateral and <2 pm vertical resolution.
  • Generated 3D datasets allowing 2D cuts parallel to the surface (atomic resolution) and along the surface normal (force field visualization).
  • Produced maps of tip-sample potential energy, lateral forces, and dissipated energy with identical high resolution.

Conclusions:

  • The presented procedures significantly reduce measurement times and improve the quality of 3D force maps.
  • Atomic resolution is achieved in both lateral and vertical dimensions, providing unprecedented detail.
  • The method allows comprehensive mapping of atomic forces and energy landscapes at the nanoscale.