Related Experiment Video
Updated: Jun 22, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
All-optical AND and NAND gates based on cascaded second-order nonlinear processes in a Ti-diffused periodically poled
Abstract:
All-optical AND and NAND gates have been demonstrated in a Ti-diffused periodically poled LiNbO(3) channel waveguide which has two second-harmonic phase-matching peaks by cascaded sum-frequency-generation/difference-frequency-generation (cSFG/DFG) and sum-frequency-generation (SFG) processes. The conversion efficiency of signal to idler (AND gate signal) was approximately 0 dB in cSFG/DFG process. In the second SFG process, more than 15 dB extinction ratio between signal and dropped signal (NAND gate signal) has been observed.
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