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Updated: Jun 22, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of

Sanjit K Debnath, Mahendra P Kothiyal, Joanna Schmit

    Optics Express
    |June 12, 2009
    PubMed

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