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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Theoretical study of gain spectrum and static gain saturation characteristics of integrated twin-guide semiconductor

Qingyuan Miao, Dexiu Huang

    Optics Express
    |June 12, 2009
    PubMed

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