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Updated: Jun 22, 2026

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator
Published on: December 15, 2021
Microresonator defects as sources of drifting cavity solitons
E Caboche1, F Pedaci, P Genevet
1Institut Non-linéaire de Nice, UMR 6618 Comité National de la Recherche Scientifique - Université de Nice Sophia-Antipolis, 06560 Valbonne, France.
Abstract:
Cavity solitons (CS) are localized structures appearing as single intensity peaks in the homogeneous background of the field emitted by a nonlinear (micro)resonator. In real devices, their position is strongly influenced by the presence of defects in the device structure. In this Letter we show that the interplay between these defects and a phase gradient in the driving field induces the spontaneous formation of a regular sequence of CSs moving in the gradient direction. Hence, defects behave as a device built-in CS source, where the CS generation rate can be set by controlling the system parameters.
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