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Updated: Jun 22, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Analytical understanding of multiple-angle incidence resolution spectrometry based on a classical electromagnetic
Yuki Itoh1, Akiyoshi Kasuya, Takeshi Hasegawa
1Department of Chemistry, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8551, Japan.
Abstract:
Infrared multiple-angle incidence resolution spectrometry (IR-MAIRS) is a unique spectroscopic technique to retrieve both surface-parallel (in-plane; IP) and -perpendicular (out-of-plane; OP) molecular vibration spectra simultaneously from an identical thin-film deposited on a high refractive index substrate, and the measurement theory was constructed by the use of a theoretical framework of regression equation. The core part of the MAIRS theory is found in the weighting factor matrix, R, used for a linear combination, which was constructed in an unusual manner. Because a regression equation does not strictly correlate the left- and right-hand sides of the equation, R matrix cannot directly be deduced from Maxwell's equation. Although the conventional studies using IR-MAIRS gave excellent empirical results, a strict physical understanding of MAIRS is necessary; otherwise, we cannot rely on it at least quantitatively. In the present study, the MAIRS theory has first been analyzed by the use of Maxwell's equations inductively. As a result, both MAIRS-IP and -OP spectra have readily been expressed as a linear combination of the Im(epsilon(x)) and Im(-1/epsilon(z)) functions that correspond to the conventional transmission and reflection-absorption spectra. Through the analysis of coefficients of the linear combination, MAIRS has proved to be reliably useful for analysis of thin film on a high refractive index substrate.
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