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Construction and Characterization of External Cavity Diode Lasers for Atomic Physics
Published on: April 24, 2014
Reliability in the oxide vertical-cavity surface-emitting lasers exposed to electrostatic discharge
Optics Express
|June 17, 2009
Summary
Electrostatic discharge (ESD) damage significantly impacts oxide VCSEL lifetime. Larger oxide apertures increase ESD threshold voltage, but thinner layers offer longer operational life post-damage.
Area of Science:
- Optoelectronics
- Semiconductor Devices
- Reliability Engineering
Background:
- Oxide Vertical-Cavity Surface-Emitting Lasers (VCSELs) are crucial optoelectronic components.
- Electrostatic discharge (ESD) poses a significant threat to the operational lifetime and reliability of oxide VCSELs.
- Understanding ESD damage mechanisms is vital for improving device longevity.
Purpose of the Study:
- To investigate the relationship between oxide aperture characteristics (size, thickness, composition) and ESD damage threshold voltage in VCSELs.
- To evaluate the impact of ESD exposure on the long-term reliability and performance degradation of oxide VCSELs.
- To correlate oxide layer properties with device lifetime after ESD events.
Main Methods:
- Fabrication and characterization of oxide VCSELs with varying oxide aperture dimensions and compositions.
- Controlled electrostatic discharge (ESD) testing to determine damage threshold voltages.
- Measurement of output power and reverse leakage current before and after ESD exposure.
- Accelerated reliability testing of both ESD-exposed and unexposed VCSELs.
Main Results:
- ESD damage threshold voltage demonstrates a positive correlation with the size of the oxide aperture, irrespective of thickness or composition.
- VCSELs with thinner oxide layers exhibited extended operational lifetimes during reliability testing, despite ESD exposure.
- ESD-affected VCSELs showed a more pronounced decline in output power during reliability tests compared to undamaged devices.
- Evidence suggests that ESD-induced defects within the active medium contribute to accelerated performance degradation.
Conclusions:
- Oxide aperture size is a critical factor in determining the ESD robustness of VCSELs.
- While larger apertures enhance ESD threshold voltage, thinner oxide layers may improve post-damage device longevity.
- ESD exposure introduces defects that significantly accelerate the degradation rate of VCSELs, impacting their long-term reliability.
