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Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light
P Albella1, J M Saiz, J M Sanz
1Grupo de Optica, Departamento de Física Aplicada, Facultad de Ciencias Universidad de Cantabria, Avda de los Castros s/n, 39005 Santander, Spain. albellap@unican.es
Optics Letters
|June 17, 2009
Abstract:
We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe-surface distance or in the refractive index of the surface.
