Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Thermal Stress

Thermal Stress

If the temperature of an object is changed while it is prevented from expanding or contracting, the object is subjected to stress. The stress is compressive if the object expands in the absence of constraint and tensile if it contracts. This stress resulting from temperature change is known as thermal stress. It can be quite large and can cause damage. To avoid this stress, engineers may design components so they can expand and contract freely. For instance, on highways, gaps are deliberately...

X-ray Imaging

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...

Thermal Strain

Thermal Strain

Thermal strain is a concept that arises when we consider how temperature changes affect structures. Unlike the conventional assumption that structures remain constant under load, real-world scenarios often involve temperature fluctuations that can significantly impact these structures. Consider a homogeneous rod with a uniform cross-section resting freely on a flat horizontal surface. If the rod's temperature increases, the rod elongates. This elongation is proportional to the temperature...

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Observation of replica symmetry breaking in filamentation and multifilamentation.

Nanophotonics (Berlin, Germany)·2025

Same author

Fault Detection and Diagnosis in Industry 4.0: A Review on Challenges and Opportunities.

Sensors (Basel, Switzerland)·2025

Same author

Nonlinear optical characterization of opaque and scattering media: from rough surfaces to powder.

Optics letters·2024

Same author

Second-Order Nonlinearity of Graphene Quantum Dots Measured by Hyper-Rayleigh Scattering.

Materials (Basel, Switzerland)·2023

Same author

In-Loco Optical Spectroscopy through a Multiple Digital Lock-In on a Linear Charge-Coupled Device (CCD) Array.

Sensors (Basel, Switzerland)·2023

Same author

Intensity-Dependent Optical Response of 2D LTMDs Suspensions: From Thermal to Electronic Nonlinearities.

Nanomaterials (Basel, Switzerland)·2023

Search research articles

Related Experiment Video

Updated: Jun 22, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Thermally managed eclipse Z-scan.

A S L Gomes, E L Filho, Cid B de Araújo

|June 18, 2009

Summary

We present an improved Z-scan method for characterizing optical nonlinearity in materials. This technique enhances sensitivity and flexibility, enabling simultaneous measurement of thermal and nonthermal nonlinearities.

Area of Science:

Photonics and Materials Science
Nonlinear Optics
Laser Spectroscopy

Background:

Characterizing optical nonlinearity is crucial for developing advanced photonic materials.
Conventional Z-scan methods face limitations in sensitivity and simultaneous thermal/nonthermal nonlinearity assessment.
Managing thermal effects is essential for accurate nonlinear optical measurements.

Purpose of the Study:

To introduce a novel variation of the Z-scan technique for enhanced characterization of third-order optical nonlinearity.
To improve the sensitivity and flexibility of nonlinear optical measurements.
To enable simultaneous measurement of both thermal and nonthermal nonlinearities in optical materials.

Main Methods:

A modified Z-scan method combining the eclipse Z-scan with thermal nonlinearity management.

More Related Videos

Scanning SQUID Study of Vortex Manipulation by Local Contact

Scanning SQUID Study of Vortex Manipulation by Local Contact

Published on: February 1, 2017

Quantitative Visualization and Detection of Skin Cancer Using Dynamic Thermal Imaging

Quantitative Visualization and Detection of Skin Cancer Using Dynamic Thermal Imaging

Published on: May 5, 2011

Related Experiment Videos

Last Updated: Jun 22, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Scanning SQUID Study of Vortex Manipulation by Local Contact

Scanning SQUID Study of Vortex Manipulation by Local Contact

Published on: February 1, 2017

Quantitative Visualization and Detection of Skin Cancer Using Dynamic Thermal Imaging

Quantitative Visualization and Detection of Skin Cancer Using Dynamic Thermal Imaging

Published on: May 5, 2011

Utilizing a femtosecond Ti-Sapphire laser operating at a 76 MHz repetition rate.

Measuring the nonlinear refractive index of standard materials (CS(2), SiO(2), H(2)O) and a biomaterial (Tryptophan in water).

Main Results:

Demonstrated improved sensitivity and flexibility in characterizing optical nonlinearity.
Successfully achieved simultaneous measurement of thermal and nonthermal nonlinearities.
Validated the method on various materials, including liquids and biomaterials.

Conclusions:

The new Z-scan variation offers a more comprehensive approach to nonlinear optical material characterization.
This method provides a powerful tool for researchers in photonics and materials science.
The technique's applicability to both standard and biological materials highlights its versatility.