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Updated: Jun 22, 2026

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
J A Beck1, G J Budgell, D A Roberts
1North Western Medical Physics, Christie Hospital NHS Foundation Trust, Withington, Manchester M20 4BX, United Kingdom. james.beck@physics.cr.man.ac.uk
Amorphous silicon electronic portal imaging devices (EPIDs) are effective for linear accelerator electron beam quality control. They provide accurate daily constancy checks, showing good agreement with ion chamber measurements.
10:25Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
09:49In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
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