Related Experiment Video
Updated: Jun 22, 2026

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
Published on: October 23, 2018
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
1Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic. chal@fzu.cz
Abstract:
A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.
More Related Videos
11:47Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Published on: February 27, 2013
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
Related Concept Videos
Atomic Absorption Spectroscopy: Radiation and Light Sources
Two common narrow-range 'line' sources used in AAS are hollow-cathode lamps (HCLs) and...
Confocal Fluorescence Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Overview
Atomic Fluorescence Spectroscopy