Phase Contrast and Differential Interference Contrast Microscopy
IR Spectrometers
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Updated: Jun 22, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
We developed a new microscope interferometric technique using two Gaussian beams to measure microscopic optical surface roughness. This method provides a linear response, accurately measuring surface height with a high signal-to-noise ratio.
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