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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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When a wave travels from one medium to another, it gets reflected at the boundary of the second medium. A common example of this is when a person yells at a distance from a cliff and hears the echo of their voice. The sound waves (longitudinal waves) traveling in the air are reflected from the bounding cliff. Similarly, flipping one end of a string whose other end is tied to a wall causes a pulse (transverse wave) to travel through the string, which gets reflected upon reaching the wall. In...
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Related Experiment Video

Updated: Jun 22, 2026

Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-P&#233;rot Etalon
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Double reflection in the concave reflective blazed grating.

Cheng-Hao Ko, Wei-Chih Liu, Nien-Po Chen

    Optics Express
    |June 24, 2009
    PubMed
    Summary
    This summary is machine-generated.

    Researchers discovered double reflection diffraction in miniature spectrometers, simplifying microelectromechanical systems (MEMS) fabrication. This finding enhances the design of integrated optics and photonics spectrometer chips.

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    Area of Science:

    • Optics and Photonics
    • Integrated Optics
    • Spectrometer Design

    Background:

    • Miniature spectrometers are crucial for integrated optics and photonics.
    • Blazed gratings with Rowland circle structures offer self-focusing advantages for spectrometer chips.

    Purpose of the Study:

    • To investigate blaze angle design in visible spectrum miniature spectrometers.
    • To understand the phenomenon of double reflection diffraction and its parameters.
    • To assess the manufacturability and performance of spectrometers utilizing this phenomenon.

    Main Methods:

    • Simulations were conducted for blaze angle design in the visible spectrum.
    • The phenomenon of double reflection diffraction was identified and analyzed.
    • Performance and manufacturing ease were compared to standard blazed gratings.

    Main Results:

    • The phenomenon of double reflection diffraction was discovered during simulations.
    • The cause and parameter space of this phenomenon were discussed.
    • Spectrometers using this phenomenon show comparable performance to standard designs.

    Conclusions:

    • Double reflection diffraction offers an easier manufacturing route for spectrometer chips using microelectromechanical systems (MEMS) technology.
    • This discovery simplifies the design process for spectrometer chips.
    • The findings have significant implications for the advancement of integrated optics and photonics devices.