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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Effectiveness of recycling light in ultra-bright short-arc discharge lamps

Asher Malul, Doron Nakar, Daniel Feuermann

    Optics Express
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    PubMed

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