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Updated: Jun 22, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Single-arm three-wave interferometer for measuring dispersion of short lengths of fiber
Abstract:
We present a simple fiber-based single-arm spectral interferometer to measure directly the second-order dispersion parameter of short lengths of fiber (< 50 cm). The standard deviation of the measured dispersion on a 39.5-cm-long SMF28(TM) fiber is 1x10(-4) ps/nm, corresponding to 1% relative error, without employing any curve fitting. Our technique measures the second-order dispersion by examining the envelope of the interference pattern produced by three reflections: two from the facets of the test fiber and one from a mirror placed away from the fiber facet at a distance that introduces the same group delay as the test fiber at the measured wavelength. The operational constraints on system parameters, such as required bandwidth, wavelength resolution, and fiber length, are discussed in detail. Experimental verification of this technique is carried out via comparison of measurements of single mode fiber (SMF28(TM)) with published data and via comparison of measurements of a dispersion compensating fiber with those taken using conventional techniques. Moreover, we used this new technique to measure the dispersion coefficient of a 45-cm-long twin-hole fiber over a 70 nm bandwidth. It is the first time dispersion measurement on this specialty fiber is reported.

