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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
High-order dispersion in photonic crystal waveguides
Solomon Assefa1, Yurii A Vlasov
1IBM TJ Watson Research Center, Yorktown Heights, NY 10536, USA. sassefa@us.ibm.com
High-order dispersion in photonic crystal waveguides was accurately measured using integrated Mach-Zehnder interferometers. Results highlight the critical role of third-order and fourth-order dispersion in slow-light pulse broadening.
Area of Science:
- Photonics
- Optical Engineering
- Materials Science
Background:
- Slow-light phenomena in photonic crystals enable enhanced light-matter interactions.
- High-order dispersion effects can significantly impact optical pulse propagation in waveguides.
Purpose of the Study:
- To accurately measure high-order dispersion in photonic crystal waveguides operating in the slow-light regime.
- To compare experimental dispersion measurements with theoretical predictions.
- To investigate the influence of third-order and fourth-order dispersion on pulse broadening.
Main Methods:
- Utilized integrated Mach-Zehnder interferometer (MZI) structures for precise dispersion measurements.
- Employed 3D plane-wave calculations for theoretical dispersion analysis.
- Minimized external phase distortions and enhanced signal-to-noise ratio for high accuracy.
Main Results:
- Experimental measurements of group-velocity dispersion (GVD), third-order dispersion (TOD), and fourth-order dispersion (FOD) were obtained at high group-index (n(g)) values (approximately 100).
- Measured dispersion parameters were approximately 10^2 ps²/mm for GVD, 10^4 ps³/mm for TOD, and 10^5 ps³/mm for FOD.
- Experimental results showed good agreement with theoretical calculations.
Conclusions:
- High-order dispersion, specifically TOD and FOD, significantly affects pulse broadening in slow-light photonic crystal waveguides.
- Accurate characterization of these dispersion effects is crucial for designing and optimizing slow-light devices.
- The integrated MZI approach provides a robust method for high-precision dispersion metrology.
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