Interference and Diffraction
X-ray Crystallography
Determination of Crystal Structures
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Updated: Jun 22, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Guillaume Demésy1, Frédéric Zolla, André Nicolet
1Institut Fresnel, UMR CNRS 6133, Faculté de Saint Jérôme, case 162, 13397 Marseille Cedex 20, France. uillaume.demesy@fresnel.fr
This study introduces a new Finite Element Method (FEM) formulation for analyzing anisotropic gratings on isotropic substrates. The method accurately models complex grating behaviors, revealing non-symmetric diffracted fields even in symmetric configurations.
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