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Updated: Jun 22, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
On the accuracy of thermionic electron emission models. I. Electron detachment from SF6(-)
Jürgen Troe1, Thomas M Miller, Albert A Viggiano
1Institut für Physikalische Chemie, Universität Göttingen, Tammannstrasse 6, D-37077 Göttingen, Germany. shoff@gwdg.de
Abstract:
Detailed statistical rate calculations combined with electron capture theory and kinetic modeling for the electron attachment to SF(6) and detachment from SF(6)(-) [Troe et al., J. Chem. Phys. 127, 244303 (2007)] are used to test thermionic electron emission models. A new method to calculate the specific detachment rate constants k(det)(E) and the electron energy distributions f(E,epsilon) as functions of the total energy E of the anion and the energy epsilon of the emitted electrons is presented, which is computationally simple but neglects fine structures in the detailed k(det)(E). Reduced electron energy distributions f(E,epsilon/
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