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Updated: Jun 22, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Anthony D Patrick1, Xiao Dong, Thomas C Allison
1Computational Materials Science Center, George Mason University, 4400 University Dr. MSN 6A2, Fairfax, Virginia 22030, USA.
A new tight-binding model for silicon carbide (SiC) predicts stable nanocluster and nanotube structures. These SiC nanostructures exhibit tunable electronic properties, functioning as semiconductors, insulators, or metals.
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