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Corrected direct force balance method for atomic force microscopy lateral force calibration.

David B Asay¹, Erik Hsiao, Seong H Kim

¹Department of Chemical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.

The Review of Scientific Instruments

|July 2, 2009

Summary

This study corrects the direct force balance method for atomic force microscopy lateral calibration. The improved method accounts for tip sliding on sloped surfaces, enhancing calibration accuracy.

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Area of Science:

Atomic Force Microscopy
Surface Science
Nanotechnology

Background:

The direct force balance method (DFBM) is used for lateral calibration in atomic force microscopy.
Previous DFBM assumed a pinned tip-substrate contact, neglecting sliding.
Tip sliding during force-distance measurements on sloped surfaces has been observed.

Purpose of the Study:

To report corrections and improvements to the direct force balance method (DFBM).
To address the assumption of pinned tip-substrate contact in the original DFBM.
To present an accurate force balance for lateral force calibration in atomic force microscopy.

Main Methods:

Utilizing lateral force signals from force-distance measurements on sloped surfaces.
Relating lateral force signals to applied load and surface slope.
Incorporating experimental observations of tip sliding during measurements.

Main Results:

Identified and corrected the assumption of pinned tip-substrate contact in DFBM.
Developed an improved force balance equation accounting for tip sliding.
Demonstrated enhanced accuracy in lateral calibration through corrected force balance.

Conclusions:

The previously reported DFBM required corrections due to unaddressed tip sliding.
The revised force balance provides a more accurate method for lateral calibration.
Accurate lateral calibration is crucial for reliable atomic force microscopy measurements.