Near- to far-field imaging of phase evolution of light emanating from a metal nanoslit

We report near- to far-field measurement of optical wavefronts emanating from a nanoslit formed in a thin (50 nm thick) Ag film. The evolution of optical phases is imaged using a self-interference technique in conjunction with a scanning probe method. The phase relationship of the slit-transmitted waves with respect to the direct transmission through the thin metal film is quantitatively established. The singular-phase points resulting from the interplay of slit diffraction and surface plasmons are identified in the intermediate-field region.