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Updated: Jun 21, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
06:43

Writing and Low-Temperature Characterization of Oxide Nanostructures

Published on: July 18, 2014

Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide-nitride-oxide dielectric

N Nikolaou1, P Dimitrakis, P Normand

  • 1Institute of Microelectronics, NCSR Demokritos, GR-5310 Aghia Paraskevi, Greece.

Nanotechnology
|July 9, 2009
PubMed

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