[Measurement of residual effect in the amorphous selenium flat panel detector system]

Area of Science:

• Medical Imaging Physics
• Materials Science

Context:

• Flat panel detectors (FPDs) are crucial in digital radiography.
• Amorphous selenium (a-Se) is a common material for direct-conversion FPDs.
• Residual image artifacts can degrade diagnostic image quality.

Purpose:

• To quantify the residual image effect in amorphous selenium flat panel detector systems (a-Se FPD).
• To determine the time required for a-Se FPDs to return to a baseline state after X-ray exposure.

Summary:

• A lead shield partially covered an a-Se FPD during X-ray irradiation to create distinct irradiated and unirradiated regions.
• Subsequent uniform irradiations were performed at varying time intervals.
• Pixel value differences between regions were measured to assess residual signal decay.

Impact:

• Established that a-Se FPD systems require up to 20 hours for complete signal recovery.
• Provides critical data for optimizing imaging protocols and understanding detector limitations.
• Informs the development of strategies to mitigate residual image artifacts in medical imaging.