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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

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Metallic and ferromagnetic edges in molybdenum disulfide nanoribbons

A R Botello-Méndez1, F López-Urías, M Terrones

  • 1Laboratory for Nanoscience and Nanotechnology Research (LINAN) and Advanced Materials Department, IPICYT, Camino a la Presa San José 2055, Coloniá Lomas 4a sección, San Luis PotosíSLP, 78216, Mexico.

Nanotechnology
|July 22, 2009
PubMed

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