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Preparation of Samples for Electron Microscopy
Scanning Electron Microscopy
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Updated: Jun 21, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Fernando Cortés-Salazar1, Markus Träuble, Fei Li
1Laboratoire d'Electrochimie Physique et Analytique, Ecole Polytechnique Fédérale de Lausanne, Station 6, CH-1015 Lausanne, Switzerland.
A novel soft stylus microelectrode probe enables scanning electrochemical microscopy (SECM) on challenging surfaces. This flexible probe allows for detailed imaging of rough and tilted substrates in contact mode, overcoming previous limitations.
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