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Updated: Jun 21, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

A single-atom sharp iridium tip as an emitter of gas field ion sources

Hong-Shi Kuo1, Ing-Shouh Hwang, Tsu-Yi Fu

  • 1Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, Republic of China.

Nanotechnology
|July 29, 2009
PubMed

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