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Updated: Jun 21, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
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Scanning-probe Single-electron Capacitance Spectroscopy

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Attofarad resolution capacitance-voltage measurement of nanometer scale field effect transistors utilizing ambient

Ali Gokirmak1, Hazer Inaltekin, Sandip Tiwari

  • 1Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT 06269, USA. gokirmak@engr.uconn.edu

Nanotechnology
|July 29, 2009
PubMed

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