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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Quantitative Hardness Measurement by Instrumented AFM-indentation

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Published on: November 22, 2016

A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force

Soma Das¹, P A Sreeram, A K Raychaudhuri

¹DST Unit for Nanoscience, S N Bose National Centre for Basic Sciences, Block JD, Sector III, Kolkata 700098, India.

|July 29, 2009

Summary

This summary is machine-generated.

Atomic Force Microscope (AFM) cantilevers exhibit inherent instability causing "jump-into-contact." This phenomenon enables precise measurement of van der Waals interactions and the Hamaker constant for materials.

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Published on: December 2, 2022

Area of Science:

Materials Science
Surface Physics
Nanotechnology

Background:

Atomic Force Microscopy (AFM) is a powerful tool for surface analysis.
The 'jump-into-contact' phenomenon in AFM cantilevers is a critical aspect of tip-sample interactions.
Understanding these interactions is crucial for accurate material characterization.

Purpose of the Study:

To investigate the underlying cause of the 'jump-into-contact' instability in AFM cantilevers.
To develop a novel method for measuring material properties based on this instability.
To establish a new technique for quantifying van der Waals interactions and the Hamaker constant.

Main Methods:

Analysis of AFM cantilever motion in a nonlinear force field using a simplified model.
Experimental verification using various materials (mica, Si wafer, silver film) and AFM cantilevers.
Derivation of the Hamaker constant from cantilever deflection at 'jump-into-contact', force constant, and tip radius.

Main Results:

The 'jump-into-contact' is an inherent instability of the AFM cantilever motion.
The 'jump-into-contact' distance directly relates to tip-sample interaction forces.
A new method for measuring the Hamaker constant for van der Waals interactions was successfully demonstrated.
The method accurately determines surface location based on cantilever deflection.

Conclusions:

The 'jump-into-contact' instability provides a robust method for characterizing van der Waals interactions.
This technique offers a new pathway for precise Hamaker constant determination.
The study validates the applicability of this method for surfaces dominated by van der Waals forces.