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Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and
Anton V Naumov1, Oleg A Kuznetsov, Avetik R Harutyunyan
1Department of Chemistry, and Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, Texas 77005, USA.
Abstract:
A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.
