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Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam
Tsu-Shin Chan1, Mykhaylo M Dvoynenko, Chih-Yi Liu
1Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan.
Abstract:
Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
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