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In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence
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Published on: June 13, 2020

The second order diffraction efficiency measurements in the vacuum ultraviolet.

Yi Qu1, Shurong Wang, Zhenduo Zhang

  • 1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China. quyi972@sohu.com

Optics Express
|August 6, 2009
PubMed
Summary

A new method measures second order diffraction efficiency in vacuum ultraviolet (VUV) spectroscopy. This technique uses spectral reflectance data to calculate efficiency, crucial for VUV optical component characterization.

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Area of Science:

  • Optics and Photonics
  • Spectroscopy
  • Materials Science

Background:

  • Second order diffraction impacts spectral reflectance measurements in spectrophotometry.
  • Accurate characterization of optical components in the vacuum ultraviolet (VUV) is essential for various scientific applications.

Purpose of the Study:

  • To present a simple and effective method for measuring second order diffraction efficiency in the VUV region.
  • To enable precise quantification of VUV spectral reflectance influenced by diffractive effects.

Main Methods:

  • Utilized a spectrophotometer system without filters.
  • Employed a deuterium lamp as the light source.
  • Used a scintillated photomultiplier for detection.
  • Calculated second order diffraction efficiency from spectral reflectance values.

Main Results:

  • The method allows determination of second order diffraction efficiency between 120 nm and 165 nm.
  • A specific result of 0.00579+/-11.9% was obtained at 161 nm.

Conclusions:

  • The described method provides a straightforward approach for VUV second order diffraction efficiency measurement.
  • This technique enhances the accuracy of VUV spectral reflectance characterization.