Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Visualizing Metal Nanoparticle Electrochemical Dissolution Atom by Atom.

Small (Weinheim an der Bergstrasse, Germany)·2026
Same author

Solvent-Dependent Carbon-to-Metal Hydrogen Atom Transfer Reactivity of a Square Planar Rhodium(II) Alkynyl Complex.

Organometallics·2026
Same author

Multiscale Analysis of Electrochemical Dealloying of Bimetallic Nanoparticles to Tune Catalytic Activity.

ACS applied materials & interfaces·2026
Same author

Optical and Electron Transparent Polycrystalline Boron Doped Diamond Membranes for Nanoscale Correlative Structure-Electrochemical Measurements.

ACS nano·2025
Same author

Investigation of Short Chain PFAS Degradation Efficiency Using Free-Standing Boron Doped Diamond Electrodes at High Current Density in a Flow Cell.

ACS electrochemistry·2025
Same author

Free-Standing Boron Doped Diamond Slot Electrodes for UV-Visible Spectroelectrochemistry: Electrochemical Advanced Oxidation and Metal Ion Reduction.

ACS electrochemistry·2025

Related Experiment Video

Updated: Jun 21, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Carbon nanotube tips for atomic force microscopy.

Neil R Wilson1, Julie V Macpherson

  • 1Department of Physics, University of Warwick, Coventry, UK.

Nature Nanotechnology
|August 8, 2009
PubMed
Summary

Carbon nanotubes offer improved atomic force microscopy (AFM) tips for enhanced surface imaging. Research explores their history, applications, and performance improvements for materials and surface science.

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) is a routine tool for structural characterization of surfaces.
  • Conventional AFM tips have limitations in resolution, durability, and invasiveness.
  • Carbon nanotubes (CNTs) show promise for advanced AFM tip development.

Purpose of the Study:

  • To review the historical development of CNT-based AFM tips.
  • To explore current applications of CNT-AFM tips.
  • To discuss research aimed at enhancing CNT-AFM tip performance.

Main Methods:

  • Literature review of CNT-AFM tip research.
  • Analysis of fabrication techniques and material properties.
  • Examination of performance metrics in various applications.

More Related Videos

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Related Experiment Videos

Last Updated: Jun 21, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Main Results:

  • CNTs offer superior mechanical properties and smaller tip radii compared to conventional tips.
  • CNT-AFM tips enable higher resolution and more faithful surface topography imaging.
  • Ongoing research focuses on improving CNT alignment, stability, and integration.

Conclusions:

  • CNT-AFM tips represent a significant advancement over traditional tips.
  • Further research and development are crucial for widespread adoption and unlocking full potential.
  • CNT-AFM technology promises to enhance nanoscale imaging across scientific disciplines.