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Updated: Jun 21, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Minority carrier effects in nanoscale Schottky contacts

Lifeng Hao1, P A Bennett

  • 1School of Materials, Arizona State University, Tempe, AZ 85287, USA.

Nanotechnology
|August 13, 2009
PubMed

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