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Updated: Jun 20, 2026
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Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
Published on: August 5, 2020
Model-based estimation of thin multi-layered media using ultrasonic measurements.
Fredrik Hägglund1, Jesper Martinsson, Johan E Carlson
1EISLAB, Department of Computer Science and Electrical Engineering, Luleå University of Technology, Luleå, Sweden. Fredrik.Hagglund@ltu.se
Summary
This study introduces a parametric layer model for analyzing ultrasonic waveforms in multi-layered materials. The model simplifies echo analysis, enabling extraction of physical properties even with overlapping echoes.
Area of Science:
- Materials Science
- Non-Destructive Testing
- Acoustics
Background:
- Ultrasonic analysis of multi-layered materials is challenging due to overlapping and reverberant echoes.
- Extracting information from individual layers is difficult when echoes are not clearly detectable.
Purpose of the Study:
- To develop a parametric layer model for analyzing multi-layered materials using a system identification approach.
- To connect model parameters to physical properties like reflection coefficients, time-of-flight, and attenuation.
Main Methods:
- Utilized a parametric layer model within a system identification framework.
- Developed a system of linear equations for both pulse-echo and through-transmission measurements.
- Employed parameter estimation and optimization algorithms for model refinement.
Main Results:
- The model's complexity depends on the number of layers, not observable echoes.
- Successfully validated the model on a 3-layered structure with overlapping echoes.
- Established a clear relationship between model parameters and the material's physical properties.
Conclusions:
- The parametric layer model effectively analyzes ultrasonic waveforms in complex multi-layered materials.
- This approach overcomes limitations posed by overlapping echoes in ultrasonic testing.
- The model provides a robust method for determining material properties from ultrasonic measurements.
