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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Three-Dimensional Microscopy in Microbiology01:28

Three-Dimensional Microscopy in Microbiology

Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...

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Related Experiment Video

Updated: Jun 20, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Multi-dimensional and multi-signal approaches in scanning transmission electron microscopes.

C Colliex1, N Brun, A Gloter

  • 1Laboratoire de Physique des Solides (UMR CNRS 8502), Building 510, Université Paris Sud 11, 91405 Orsay, France. colliex@lps.u-psud.fr

Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences
|August 19, 2009
PubMed
Summary

Advancements in electron microscopy instrumentation enable atomic-level exploration of nanoworld objects. Improved electron optics and detectors enhance spatial and energy resolution, driving new scientific discoveries.

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Last Updated: Jun 20, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
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Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy

Published on: July 15, 2021

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

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Area of Science:

  • Electron microscopy
  • Nanotechnology
  • Spectroscopy

Background:

  • Instrumentation is crucial for scientific advancement, particularly in electron microscopy.
  • Recent progress in hardware and digital data processing has expanded microscopy applications.
  • Breakthroughs in electron optics and detectors have significantly improved performance limits.

Purpose of the Study:

  • To highlight the impact of recent instrumentation developments in electron microscopy.
  • To showcase the extended capabilities for exploring the nanoworld.
  • To emphasize the role of enhanced electron energy-loss spectroscopy (EELS) in nanophotonics.

Main Methods:

  • Improvements in electron optics, including correctors, filters, and monochromators.
  • Advancements in detector efficiency and digital data acquisition/processing.
  • Enhanced energy resolution in electron energy-loss spectroscopy (EELS).

Main Results:

  • Achieved ultimate atomic-level exploration of nanoworld objects.
  • Extended spatial resolution in imaging and sensitivity for single-atom identification.
  • Broadened information range with improved EELS energy resolution into the visible spectrum.
  • Enabled nanolaboratory device integration with spherical aberration correctors.

Conclusions:

  • Modern electron microscopy instrumentation allows unprecedented atomic-scale characterization.
  • Enhanced EELS provides powerful insights for nanophotonics development.
  • Spherical aberration correctors facilitate advanced in-situ experiments at the nanoscale.