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Updated: Jun 20, 2026

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Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters
Published on: February 4, 2018
Summary
A novel wavelength meter precisely measures pulsed laser absolute wavelength to 1 part in 10^6. This device utilizes five Fizeau interferometers and microcomputer analysis for accurate laser wavelength determination.
Area of Science:
- * Optics and Photonics
- * Laser Metrology
- * Interferometry
Background:
- * Precise measurement of laser wavelength is critical for various scientific and industrial applications.
- * Existing methods for absolute wavelength measurement of pulsed lasers can be complex and less accurate.
- * The need for high-precision, reliable wavelength determination drives innovation in optical metrology.
Purpose of the Study:
- * To describe a new wavelength meter for measuring the absolute wavelength of pulsed laser radiation.
- * To achieve a measurement accuracy of 1 part in 10^6.
- * To present a practical and robust system for laser wavelength characterization.
Main Methods:
- * Construction of a wavelength meter comprising five Fizeau (optical-wedge) interferometers.
- * Simultaneous fringe capture from a standard Helium-Neon (He-Ne) laser and an unknown pulsed laser.
- * Utilization of a television camera interfaced with a microcomputer for fringe analysis and wavelength calculation.
Main Results:
- * Successful demonstration of a wavelength meter capable of measuring absolute wavelength with high precision.
- * Achieved accuracy of 1 part in 10^6 for pulsed laser radiation measurement.
- * The system effectively processes fringe data for accurate wavelength determination.
Conclusions:
- * The developed Fizeau interferometer-based wavelength meter offers a significant advancement in pulsed laser metrology.
- * The system provides a reliable and accurate method for absolute wavelength measurement.
- * This technology has potential applications in fields requiring precise laser characterization.

