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Updated: Jun 20, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Critically coupled surface phonon-polariton excitation in silicon carbide
Burton Neuner1, Dmitriy Korobkin, Chris Fietz
1Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA. bhn69@physics.utexas.edu
Abstract:
We observe critical coupling to surface phonon-polaritons in silicon carbide by attenuated total reflection of mid-IR radiation. Reflectance measurements demonstrate critical coupling by a double scan of wavelength and incidence angle. Critical coupling occurs when prism coupling loss is equal to losses in silicon carbide and the substrate, resulting in maximal electric field enhancement.
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