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Published on: January 3, 2016
Nanoparticle characterization by using tilted laser microscopy: back scattering measurement in near field
D Brogioli1, D Salerno, V Cassina
1Dipartimento di Medicina Sperimentale, Università degli Studi di Milano-Bicocca, Via Cadore 48, Monza (MI) 20052, Italy.
Optics Express
|September 3, 2009
Summary
This study introduces Tilted Laser Microscopy (TLM) to enable back-scattering measurements for nanoparticle characterization. This novel technique extends near field scattering capabilities beyond 90 degrees, overcoming previous limitations.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Microscopy-based light scattering techniques are crucial for nanoparticle characterization.
- Existing methods are limited to forward scattering (max 30 degrees).
- A need exists for techniques capable of measuring back-scattering for comprehensive analysis.
Purpose of the Study:
- To present a novel optical scheme, Tilted Laser Microscopy (TLM), for extending near field scattering measurements.
- To enable detection of light scattering at angles greater than 90 degrees (back-scattering).
- To validate the extended theory and experimental setup for nanoparticle characterization.
Main Methods:
- Implementation of a novel optical scheme using a standard microscope, a wide numerical aperture objective, and angled laser illumination (TLM).
- Extension of near field scattering theory to accommodate strongly out-of-axis scattering conditions.
- Experimental validation using calibrated spherical nanoparticles with static and dynamic light scattering measurements.
Main Results:
- Successfully extended detection range for near field light scattering to over 90 degrees (back-scattering).
- Static scattering spectra and dynamic decay times align with Mie theory and Stokes-Einstein equation predictions.
- Demonstrated compatibility with calibrated nanoparticles across various diameters.
Conclusions:
- Tilted Laser Microscopy (TLM) effectively enables back-scattering measurements, significantly expanding the utility of near field scattering techniques.
- This advancement opens new avenues for analyzing systems exhibiting strong angle-dependent scattering.
- The validated method provides accurate characterization of nanoparticle dispersions.
